Percutaneous management of residual shunts after initial patent foramen ovale (PFO) device closure

  • Dr Jaspal Dua, IRCCS Policlinico San Donato, Milan, Italy, Italy
  • Dr Massimo Chessa, IRCCS Policlinico San Donato, Milan, Italy, Italy
  • Dr Alessandro Giamberti, IRCCS Policlinico San Donato, Milan, Italy, Italy
  • Dr Halkawt Nuri, IRCCS Policlinico San Donato, Milan, Italy, Italy
  • Dr Luciane Piazza, IRCCS Policlinico San Donato, Milan, Italy, Italy
  • Dr Gianfranco Butera, IRCCS Policlinico San Donato, Milan, Italy, Italy
  • Dr Claudio Bussadori, IRCCS Policlinico San Donato, Milan, Italy, Italy
  • Dr Mario Carminati, IRCCS Policlinico San Donato, Milan, Italy, Italy
  • Objective

    Percutaneous closure of the patent foramen ovale (PFO) is well established, though residual shunts or iatrogenic atrial septal defects increase the risk of recurrent events by upto fourfold. Treatment options include medical therapy, surgery or possible percutaneous implantation of second device. The best therapeutic approach is not clear; it is also not clear if a second device implantation is feasible, what are the risks and long-term follow-up?
    We report four cases with percutaneous management of significant residual atrial shunting.

    Methods

    Between 01/2000-12/2006, 1100 patients underwent percutaneous PFO closure. A significant proportion had history of paradoxical embolism or migraine. The patients were followed-up at 1,6,12 months (Transcranial Doppler at 6 months). Amongst these, four had a significant residual shunt and/or a second neurological event and underwent cardiac catheterisation.

    Results

    All four had significant residual shunts and underwent an Amplatzer device implantation (See Table) under fluoroscopy and echocardiographic guidance. They were discharged on Aspirin 300mgs for 6-months. None had any residual shunt post-procedure and are doing well on follow-up at 3yrs.

    Conclusion

    All patients had the second device closure at least 6-months after the first device, by which, the endothelisation of the initial device was likely to be complete. Technically, the second device implantation was no more challenging than the first procedure. In this small series, the second ‘interval’ device implantation has proved to be safe and effective in eliminating a significant residual or iatrogenic shunt and the associated neurological risks. A larger series and a longer follow-up are mandatory.

    Age(yrs) Diagnosis First Device Implanted Repeat Neurological Event Second Intervention At Residual Shunt Pre-Second Intervention Etiology Second Device Implanted Residual Shunt at Follow-Up
    67 Stroke, PFO Amplatzer PFO Occluder 25 mm No 12 months Moderate Probable erosion Amplatzer Septal Occluder 6 mm None
    22 Stroke, WPW, PFO Amplatzer PFO Occluder 25 mm No 12 months Moderate Iatrogenic ASD Amplatzer Septal Occluder 4 mm None
    39 Stroke, PFO Starflex Device 28 mm Yes: TIA 11 months Moderate Shunt through PFO tunnel Amplatzer PFO Occluder 18 mm None
    57 TIA, PFO Amplatzer Cribriform Occluder 25 mm Yes: TIA 10 months Large Shunt through PFO Amplatzer PFO Occluder 18 mm None